MT25QL128ABA is a high-performance multiple input/output, 128Mb, 3V, SPI Flash memory device.

DC Characteristics; VIH and VIL

PP= 12, 14, SE, SF, W7, W9. TT= IT, AT.

Verilog model MT25QL128ABA8E0

This tech note describes considerations in thermal applications for Micron memory devices, including thermal impedance, thermal resistance, junction temperature, operating temperature, memory reliability, reliability modeling, device reliability, and high-temperature electronics.

This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Explanation of Micron packaging labels and procedures.

Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.